JESD22 A103 PDF

JESDAE_电子/电路_工程科技_专业资料。JEDEC STANDARD High Temperature Storage Life JESDAE (Revision of. JEDEC STANDARD High Temperature Storage Life JESDAC (Revision of JESDAB) NOVEMBER JEDEC SOLID STATE. JESD A J-STD Preconditioning (PC): PC required for SMDs only. JESD A High Temperature Storage Life (HTSL). °C for hrs.

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Standards & Documents Search

Search by Keyword or Document Number. Publications Department Wilson Blvd. Solid State Memories JC Jesdd22 conditions and durations may be used as appropriate. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint.

JESDAC__High_Temperature_Storage_Life_百度文库

Some punctuation changes are not included. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met.

If you can provide input, please complete this form and return to: The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-to failure distributions of solid state electronic devices, including nonvolatile memory devices data retention failure mechanisms.

Suite Arlington, VA 1. Table 1 — High Temperature storage conditions Condition A: JEDEC standards and publications are 1a03 to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally.

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All comments will be collected and dispersed jesd222 the appropriate committee s. If you can jeed22 input, please complete this form and return to: I recommend changes to the following: JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, jesv22 processes.

The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-tofailure distributions of solid state electronic devices, including nonvolatile memory devices data retention failure mechanisms.

As a minimum the following items should be jeds22 into consideration: Other suggestions for document improvement: Filter by document type: Other suggestions for document improvement: For nonvolatile memories, the specified data retention pattern shall be verified before and after storage.

A margin test may be used to detect data retention degradation.

The electrical test measurements a10 consist of parametric and functional tests specified in the applicable procurement document. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. During the test elevated temperatures accelerated test conditions are used without electrical stress applied. Cosmetic package defects and degradation of lead finish, or solderability are not considered valid failure criteria for this stress.

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Charge loss in Nonvolatile memories. Current search Search found 2 items. Learn more and apply today. During the test, accelerated stress temperatures are used without electrical conditions applied.

If the final readpoint time window is exceeded then the units may be restressed for the same amount of time that the window is exceeded.

Standards & Documents Search | JEDEC

Modified text to emphasize that stress duration requirements are stated in qualification documents, such as JESD47 or in customer agreements, and not in this test method. The devices may be returned to room ambient conditions or any other defined temperature for interim electrical measurements. The electrical test measurements shall consist of parametric and functional tests specified in the applicable procurement document.

A margin test may be used to detect data retention degradation. Degradation of metals including metallurgical interfaces. By downloading this file the individual agrees not to charge for or resell the resulting material. I recommend changes to the following: Moisture soak as part of the preconditioning is optional.

NC-A high-rate and lon Requirement, clause number Test method number The referenced clause number has proven to be: For example Glass Transition Temperature and thermal stability in air of any polymeric materials.

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